The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements.
The VERTEX 80/80v optics design allows PEAK flexibility and at the same time PEAK instrument performance. The unique Bruker Optics DigiTect™ technology prevents external signal disturbance, guarantees PEAK signal-to-noise ratio and allows easy and reproducible detector exchange by the instrument user. The two optional external detector ports accommodate the liquid He dewars of bolometer and/or hot electron detectors. In combination with the external water cooled high power Hg-arc source, the recently rediscovered terahertz spectral range is accessible even with a room temperature operated DTGS-detector.
The VERTEX NEO R represents the new generation of vacuum FT-IR spectrometers, designed to set new standards in advanced research applications. With an emphasis on flexibility, precision, and innovation, it delivers the ultimate support for cutting-edge scientific exploration.
Building on 50 years of success in the FT-IR academic and research market, we proudly present our next-generation FT-IR vacuum research spectrometer VERTEX NEO R. Designed with cutting-edge technology and well-proven unique features, this new instrument is not just an upgrade – it’s a revolution! More powerful electronics, more flexible optics bench, all new vacuum ATR technology, VERTEX NEO R is designed to push the boundaries of scientific discovery and continue our legacy of superior VERTEX performance.
The MGA Control software provides users with all necessary functions and controls to perform highest precision and accuracy gas mixing ratio measurements with MIRO’s MGAs. It offers an easy-to-use touch screen interface that gets new users up and running in no time thanks to a high degree of automation, while experienced users have full insight and control over the spectral fitting of the measured gas absorptions.
Powerful laser-based Gas Analyzers with ppb to ppt precision for monitoring of greenhouse gases and air pollutants
MIRO’s MGA10-GP has revolutionized and simplified the monitoring of greenhouse gases and air pollutants by enabling simultaneous online measurements of 10 gases at high measurement rates while offering excellent stability and ppt precision.
MIRO’s MGA10-GP analyzers directly measure concentrations of all compounds using mid-infrared laser absorption spectroscopy with Quantum Cascade Lasers as light sources. This allows for highly specific and accurate gas detection along with maximum measurement sensitivity without the need for conversion. Our analyzers are typically free of measurement interferences from other gas species. The intuitive touch display enables fast and easy control. The analyzer is suitable for various applications as Comparison with reference methods – MIRO Analytical (miro-analytical.com) to Mobile monitoring – MIRO Analytical (miro-analytical.com) measurements
The suppression of fluorescence can be the decisive advantage in Raman microscopy. The RamanScope III is designed to do just that, providing excellent Raman data even on difficult samples.
The benefits of FT-Raman microscopy are well known:
The analysis of milk and dairy products is essential for ensuring quality, safety, and compliance with industry standards. Fourier Transform Near Infrared (FT-NIR) technology is renowned for its rapid, non-destructive testing, ensuring precise and repeatable analysis of fat, protein, lactose, and total solids in dairy products.
The new MOVE-T is a compact FT-NIR benchtop analyzer focusing on liquid analysis from raw milk to liquid finished products, intermediates, and premixes.
Advanced FT-NIR Technology: Provides precise and reliable analysis.
Bruker’s MPA III Dairy Analyzer sets a new standard for quality control and analysis of liquid and solid samples in the dairy industry with the software-controlled Liquid Sampling Module. With homogenizer and peristaltic pump, the it has two options for sample delivery including automated cleaning cycles and visible tubing for easy inspection. The modular concept is based on Bruker’s MPA III FT-NIR instrument.
Transmission measurement through a thermostatted quartz flow cell with 1mm (1,000μm) path length for all liquids. The maintenance free design shows no cuvette wear over time. Viscous samples like concentrates can be pumped through easily, even if they contain small particles or sugar crystals.
Reflection analysis for all solid and semi-solid sample forms with the integrating sphere in sample cups for powder samples and for semi-solids in disposable polystyrene or alternatively glass or quartz Petri dishes. The sample is rotated during analysis to obtain the average result from a larger sample volume.
Thermal Analysis provides ideal tools for the characterization of organic and inorganic, either solids or liquids. Thermodynamic transitions, thermal stability, decomposition and chemical reactions can be detected and quantified with high accuracy over a broad temperature range
The identification of gases released directly from the sample or during thermal treatment cannot be performed just by thermal analysis, but coupling a spectroscopic method such as Fourier-Transform-Infrared (FT-IR) spectroscopy is an excellent solution.
The unique verTera extension upgrades the famous VERTEX 80v to the first and only combined FT-IR/continuous wave THz spectrometer.
verTera makes use of high precision semiconductor based photomixers, converting near infrared laser light into THz radiation. Source and detector are integrated into the VERTEX 80v beam path and the class 1 NIR laser radiation is connected via fiber and vacuum tight feedthrough.
Vacuum operation eliminates unwanted atmospheric interferences and provides utmost stable conditions, resulting in significantly higher THz performance.
The IFS 125HR is the ultimate instrument for the high resolution IR spectroscopy
In absorption or emission mode, the IFS 125HR can resolve highly complex spectra into discrete lines for recognition and spectral assignment.
The IFS 125HR electronics provides Ethernet connectivity and data acquisition based on the DigitectTM system using 24-bit ADC’s integrated with the detector. The standard MIR spectral range can be easily extended to the NIR, visible, or even UV.
The external accessory PMA 50 has been specially developed for Polarization Modulation measurements. It can be adapted to Bruker INVENIO and VERTEX FT-IR spectrometers. All optic and electronic components in the PMA 50 module are optimized for the Polarization Modulation. Both linear dichroitic measurement techniques like PM-IRRAS and circular dichroitic experiments like VCD spectroscopy can be realized using this dedicated system.
The core of the Polarization Modulation technique is the Photoelastic Modulator (PEM) with a nominal modulation frequency of 42 kHz. With the help of the parallel 24-bit dual-channel data acquisition technology the sum and the difference signals can be collected simultaneously with highest sensitivity. The PMA 50 module exhibits short beam path, and therefore provides optimal S/N ratio and stability.
InSight 300 is a fab-ready automated atomic force microscope (AAFM) designed for reliable, cost-effective inline metrology in high-volume semiconductor manufacturing environments. With <±1nm scanner flatness and a best-in-class noise floor of <35pm, this system meets the rigorous requirements of advanced CMP and etch applications, from micron-roughness to fully automated bare-wafer defect review. Its profilometry capabilities meet and exceed the millimeter-scale and bevel-edge metrology requirements for cutting-edge hybrid bonding applications. InSight 300 also features Bruker-proprietary operating modes for optimized measurements of sidewall roughness, automatic bare-wafer defect review, and advanced profiling of feature surfaces.
Long-Term Stability and Productivity for Advanced Process Control and Development
InSight AFP is the world’s highest performance and industry preferred CMP profiling and etch depth metrology system for advanced technology nodes. The combination of its modern tip scanner with inherently stable capacitive gauges and an accurate air-bearing positioning system enables non-destructive, direct measurements in the active area of dies.
Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressure (0.05-50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate and complete characterization of CMP processes and consumables.
The Bruker Wafer Clean 2200 System removes particulate contamination and thin film organic residues from silicon, compound semiconductor, MEMS and thin film head substrates using a unique carbon dioxide (CO2) snow cleaning process. CO2 snow cleaning is fast, environmentally friendly and non-damaging. The all-dry process offers numerous advantages over conventional wet and plasma cleaning techniques. This fully automated, high volume production system is field proven with over 100 systems running 24/7 in high volume production applications around the globe.
The SmartProber-P1 is aimed at the next-generation over 5.5 kOe. Various configurations of this type of SmartProber are available. If the high perpendicular field is required, but only small samples need to be measured, the automated wafer stage can be replaced with a cheaper manual stage.
SP-P1 – 6kOe magnet, 300mm rotary wafer-stage
Configuration options:
C: Additional in-plane magnet module with a field strength of 2kOe
Y: 200mm XY wafer-stage
M: Manual wafer-stage for small samples
L: 10kOe magnet
This low-cost table-top equipment comes with manual x-y positioning, fully automated probe landing, an in-plane magnet as well as an anti-vibration table. The open nature, low cost, and versatility make the
SmartProber-TT especially suited for research and/or development.
Sample size: up to 6″ wafers, up to 1.3 mm thickness
Bruker’s Hysitron BioSoft In-Situ Indenter is a first-of-its-kind instrument specifically designed for multiscale quantitative mechanical testing of biological materials and soft matter, such as hydrogels. BioSoft synchronizes powerful mechanical and optical characterization techniques to achieve a comprehensive understanding of the mechanics of biomaterials. This portable system integrates with existing inverted optical microscopes to bring advanced biomechanical testing capabilities into your laboratory.
