The top-of-line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level
New dual side-on interface (DSOI) adds sensitivity and eliminates contamination/matrix compatibility issues.
One instrument instead of two: Only MultiView plasma instrument in the market – true axial and true radial (single or dual) plasma observation in one instrument.
ORCA Optical System: Simultaneous spectrum capture in the 130–770 nm wavelength range with up to 5× more sensitivity than Echelle-based systems – delivers best-in-class performance in the UV/VUV range.
Redefining ICP-MS: Analytical Excellence with SPECTROGREEN MS
Top-Tier Performance: Delivers exceptional analytical capacity for routine environmental, pharmaceutical, and consumer product testing.
Advanced Technology: High-matrix interface, gas dilution system, high-power LDMOS generator, and customizable software, for superior sensitivity, stability, and ease-of-use.
Effortless Maintenance: Designed for maximum performance with minimal upkeep, featuring easily accessible components and a bonnet-supported shield for enhanced stability and longevity.
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance
Measure lower than ever and faster than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in outstanding low detection limits for a wide range of elements at even shorter measurement times (up to a factor 2).
Improved accuracy based on optimized spectra handling: Master the unknown using the benchmark in ED-XRF screening, SPECTRO’s TurboQuant II application package for the unprecedented ability to analyze unknown samples, whether they are liquids, solids or powders – whether they are tree leaves, plastics, oil, granite or glass.
Application range extended to multilayer analysis: Up to 8 layers and up to 55 elements.
SPECTRO xSORT XHH04: Handheld XRF for On-The-Spot Metal & Alloy Analysis
Ultimate on-site metal testing capability: 46 elements in 16 metal matrices in 2 seconds for most elements, 7 seconds for light elements (e.g. Al, Si, Mg); on-site calibration for elements and applications not covered by factory methods.
Designed for all-day single hand use: Balanced, size-optimized, comfortable, easy-read display; quick action software; powered by Android, designed for touch operation, quick access to all functions.
Everywhere data & documentation: GPS for the where, cameras for the what, WiFi, Bluetooth, USB and microSD to document and transmit results. Lab-on-the-go: from handheld to a mini-lab system when connected to the docking station with sample chamber.
SPECTROGREEN ICP-OES in 3 Advanced Versions: DSOI, TI, and SOP
New revolutionary Dual Side-On Interface (DSOI) technology that achieves twice the sensitivity of conventional radial-plasma-view instruments.
TI technology enables highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices.
New GigE readout system that enables spectra transport in less than 100 ms for faster analysis speeds, shorter sample-to-sample times, and more samples per hour.
Extremely agile, LDMOS generator that makes external cooling unnecessary: analyze difficult sample matrices in lower dilutions for lower limits of detection — faster warmup (~10 minutes) for higher productivity.
The High-Performance, High-Value ICP-OES for Routine Elemental Analysis
Dual Side-On Interface with up to factor 2 improved sensitivity: no second measurement, reduced matrix effects, improved accuracy, high matrix tolerance.
High measurement speed: Fast, simultaneous spectrum acquisition enabling short sample to sample time and the analysis of up to 700 samples per day.
Low operating costs: minimal 0.5 L/min optic purge, no water chiller necessary.
Small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer optimized for precious metal testing and compliance screening
The market recognized gold standard for element analysis of precious metals.
Wide scope of > 30 elements backed by extensive factory calibrations providing the best accuracy for traces and majors.
Up to a factor of 3 shorter measurement times: choose exceptional results at conventional measurement times, or conventional results at exceptional measurement times.
SPECTROSCOUT – The portable, energy-dispersive X-ray fluorescence (ED-XRF) spectrometers that bring lab-grade analysis into the field or onto the production floor
Light weight and portable elemental analyzer
Fast and on-site: Elemental analysis of rock, sediment and soil. Element range starting from Na, detection limits for relevant trace elements significantly lower compared to other portable and handheld XRF instruments.
At the production line: High productivity with application specific packages. Small footprint with high analytical power.
Handheld XRF for Geology, Mining, Environmental & Compliance Screening
Ideal for the analysis of ores, concentrates, and tailings, for environmental screening, compliance testing and quick screening of metallic and non-metallic samples.
Designed for all-day single hand use: Balanced, size-optimized, comfortable, easy-read display; quick action software; powered by Android, designed for touch operation, quick access to all functions.
Everywhere data & documentation: GPS for the where, cameras for the what, WiFi, Bluetooth, USB and microSD to document and transmit results. Lab-on-the-go: from handheld to a mini-lab system when connected to the docking station with sample chamber.
