The top-of-line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level
New dual side-on interface (DSOI) adds sensitivity and eliminates contamination/matrix compatibility issues.
One instrument instead of two: Only MultiView plasma instrument in the market – true axial and true radial (single or dual) plasma observation in one instrument.
ORCA Optical System: Simultaneous spectrum capture in the 130–770 nm wavelength range with up to 5× more sensitivity than Echelle-based systems – delivers best-in-class performance in the UV/VUV range.
SPECTROGREEN ICP-OES in 3 Advanced Versions: DSOI, TI, and SOP
New revolutionary Dual Side-On Interface (DSOI) technology that achieves twice the sensitivity of conventional radial-plasma-view instruments.
TI technology enables highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices.
New GigE readout system that enables spectra transport in less than 100 ms for faster analysis speeds, shorter sample-to-sample times, and more samples per hour.
Extremely agile, LDMOS generator that makes external cooling unnecessary: analyze difficult sample matrices in lower dilutions for lower limits of detection — faster warmup (~10 minutes) for higher productivity.
The High-Performance, High-Value ICP-OES for Routine Elemental Analysis
Dual Side-On Interface with up to factor 2 improved sensitivity: no second measurement, reduced matrix effects, improved accuracy, high matrix tolerance.
High measurement speed: Fast, simultaneous spectrum acquisition enabling short sample to sample time and the analysis of up to 700 samples per day.
Low operating costs: minimal 0.5 L/min optic purge, no water chiller necessary.
