Description
| Category | Details |
|---|---|
| Product Type | First dual-channel FT-Raman module |
| Compatibility | INVENIO and VERTEX FT-IR research spectrometer series (INVENIO, VERTEX 80, VERTEX 70v, VERTEX 80v) |
| Technology | Advanced 24-bit detector electronics and high quality optics based on Bruker’s long-term FT-Raman experience |
| Performance | Superb stability and throughput for demanding emission experiments |
| Spectral Range | 3600 – 50 cm⁻¹ (Stokes shift) |
| Laser Source | Nd:YAG laser (1064 nm) for sample excitation; fully software controlled |
| Detector Options | Room-temperature InGaAs detector and/or proprietary high-sensitivity Ge detector; liquid nitrogen cooled Germanium diode detector |
| Sensitivity Features | Ultra-low signal detection with minimal noise; high throughput optics; long hold time refrigerant for hassle-free operation |
| Standard Configuration | Motorized sample stage; white light source for instrument response correction; 90° scattering geometry switching; defocusing optics for colored samples |
| Dual System Capability | Accommodates second laser and detection system; automated polarization accessory; two fiber optic coupling ports |
| Optional Accessories | Automatic sample changers; low and high temperature stages; FT-Raman HTS accessory |
| Microscopy Options | FT-Raman microscope RamanScopeIII; Bruker compact Raman microscope SENTERRA II for μm size range samples |
| Additional Applications | Photo luminescence (PL) for semiconductor quality control and material research |
| Software | OPUS software for data collection and manipulation; automated switching between FT-Raman and FT-IR measurements |
